Keysight 3070 ICT Test Systems

Keysight 3070 ICT Test Systems

Keysight 3070 Test Fixture and Test Applications Development

i3070 ICT Systems provide sophisticated in-circuit and functional test coverage across an extensive range of circuit types, memory devices, analog and digital components, and performance criteria. Any completed solution is designed for high-specification analogue, digital, and mixed-signal devices used in today’s advanced printed circuit boards (PCBs).

Collaborate with our team at Elite Interfaces to maximize the efficiency of your test program development while conserving your internal engineering resources.

Our experienced engineers will partner with your team from the initial Design for Test (DFT) process through to line implementation and ongoing customer support.

Test program coverage can be increased with optional extras such as

  • Keysight Nano VTEP Opens Testing
  • Standard and Advanced Boundary Scan Testing
  • LED Colour Testing, Feasa, Finn Test etc.
  • Dual Height Probing (For Functional Test)
  • Side Access Connector Test with Test Plugs and RF Probes
  • Automatic Open / Close of Gate for Robot Cells
  • Automatic Barcode Scanning
  • In System Programming - FLASH, MICRO, EEPROM, CPLD, PIC etc
  • CAN and LIN Tests
  • Component Presence Testing (Switch Probes)
  • Software-Controlled actuation counter for convenient aid of fixture maintenance
  • Functional Testing - Based on Customer Requirements and Test System Resources
  • Board Pass Marking
  • FEA and Strain Gauge Testing